Supports completing complex setting in one step and acquiring all device information in one glance with Intuitive GUI; Supports data figures to overlap and compare conveniently with multi-window data display
Supports Primarius test instruments with full functionalities, mainstream probe stations, switch matrix and 3rd party instruments to perform automated testing
Support complete parameter test applications with ready-to-use testing algorithm library, such as DC, pulse, CV, transient IV, arbitrary waveform generation, noise, RF parameter tests
Supports powerful data analysis, such as real-time data processing, overlay analysis, transformation of test analysis graph images with one-click, and capable of distance, slope and correlation coefficient measurements on the graph images directly
Supports wafer-level mass data management, including wafer mapping, test plan setup efficiently, tests database auto-save and wafer-level data recall at any time
Support custom test algorithms, flexible test processes and complex mathematical calculations and analysis with built-in script programing platform
SPICE Model
PDK
Standard Cell
Design Environment
Circuit Simulation
Circuit Simulation
Design & Verification
Parametric Testing
Noise Measurement
Integrated Testing
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